Talanta 2015 134:514-523.
Lutin A, Bulatov V, Jadwat Y, Wood N et al
Endosteal dental implants are used routinely with high success rates to
rehabilitate the integrity of the dentition. However if implant surfaces become
contaminated by foreign material, osseointegration may not occur and the dental
implant will fail because of the lack of mechanical stability. Detection and
characterization of dental implant surface contaminants is a difficult task. In this
article we investigate the application of several spectral microscopy methods to
detect airborne contaminants on dental implant surfaces. We found that Fourier
Transform Spectral Imaging Microscopy (FT-SIM) and scanning Raman
microscopy provided the most useful information. Some implants possess weak
and homogeneous auto-fluorescence and are best analyzed using FT-SIM
methods, while others are Raman inactive and can be analyzed using scanning
Raman microscopy.